DESCRIPTION

The ULTRIS Series represents the next generation of high-speed spectroscopic ellipsometry, engineered for ultra-fast, non-destructive thin film measurements across a variety of industries. Designed to meet the demands of semiconductor fabrication, flexible electronics, and advanced display manufacturing, the ULTRIS Series delivers rapid, high-precision measurements of film thickness, optical constants, and uniformity across large areas. It features a robust hardware platform with a high-speed detector, advanced light source,
and automated stage, ensuring maximum throughput without compromising accuracy. Its intuitive software enables real-time data analysis, automated recipe creation, and comprehensive reporting, significantly boosting productivity on the factory floor or in the R&D lab. With ULTRIS, manufacturers and researchers can confidently control quality and accelerate time-to-market.

1.Parts Can Be Measured Regardless of Orientation
The location and orientation of the part placed on the measurement stage is automatically detected. No need for precise fixturing of the part.

2. Simultaneous measurements