DESCRIPTION

Desciption of Elite Series

The ELITE Series is the flagship spectroscopic ellipsometry system designed to deliver unparalleled performance for thin film characterization. Equipped with a wide spectral range, advanced modeling software, and high-resolution optics, the ELITE Series is perfect for cutting-edge applications in semiconductors, optoelectronics, photovoltaics, and advanced coatings. It provides precise measurements of thickness, refractive index, extinction coefficient, and complex multilayer structures, making it indispensable for both R&D labs and production lines. With its intuitive software interface, robust hardware, and extensive material library, the ELITE Series empowers users to achieve high-precision, repeatable results with minimal effort, accelerating innovation and improving product quality across industries.

Features

1. Fast Measurement.

2. Suitable for large size sample.

3. Break the conventions of size measuremnet. One machine can supply all solution.

4. Large aperture high depth of field, full field of vision imaging clear, ultra-low distortion.

5. High resolution digital camera. The instrument uses a high resolution digital camera ranging from 12 million to 43 million pixels.

6. The software adopts advanced 20:1 subpixel image edge processing.

7. Software process can automatically remove burrs and outliers, and reduce the impact on the feature location to a minimum.

8. Automatic identification of the workpiece without positioning.

9. The measurement range can measure more than 5,000 dimensions at one time, and the measurement time of 100 dimensions is less than 1 second, which greatly reduces the measurement time and improves the measurement efficiency.

10. Arbitrary placement of multiple workpieces, automatic identification,
batch measurement.